Technical Brief

Safe Wireless Power Design for Implanted Medical Devices1

[+] Author and Article Information
Vlad Bluvshtein, Lori Lucke

Minnetronix, Inc.,
St. Paul, MN 55108

Accepted and presented at the Design of Medical Devices Conference (DMD2014), Minneapolis, MN, April 7–10, 2014.

Manuscript received February 21, 2014; final manuscript received February 28, 2014; published online April 28, 2014. Editor: Arthur G. Erdman.

J. Med. Devices 8(2), 020916 (Apr 28, 2014) (2 pages) Paper No: MED-14-1045; doi: 10.1115/1.4027016 History: Received February 21, 2014; Revised February 28, 2014

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BSI, 2010, “Procedure for the Assessment of the Exposure to Electromagnetic Fields of Workers Bearing Active Implantable Medical Devices—Part 1: General,” British Standards Institution, London, Standard No. BS EN 50527-1.
IEEE2006, “C95.1-2005: IEEE Standard for Safety Levels With Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz,” IEEE, New York, Standard No. C95.1-2005. [CrossRef]
ICNIRP, 2010, “Guidelines for Limiting Exposure to Time-Varying Electric and Magnetic Fields (1 Hz to 100 kHz),”Health Phys., 99(6), pp. 818–836. [CrossRef]
Van Schuylenbergh, K., and Puers, R., 2009, Inductive Powering, Springer, New York.
Prutchi, D., Spehr, P. R., Haluska, E., and Goode, P. V., 2013, “Analysis of Temperature Increase at the Device/Tissue Interface for Implantable Medical Devices Dissipating Endogenous Heat,” Impulse Dynamics, Orangeburg, NY, available at: http://www.implantable-device.com/wp-content/uploads/2013/09/Endogenous-heat-paper-SUBMITTED-MANUSCRIPT.pdf?94fb22
Davies, C., Fukumura, F., Fukamachi, K., Muramoto, K., Himley, S., Massiello, A., Chen, J., and Harasaki, H., 1994, “Adaptation of Tissue to a Chronic Heat Load,” ASAIO J., 40(3), pp. M514–M517. [CrossRef]


Grahic Jump Location
Fig. 1

Magnetic field radiation pattern for loosely coupled coils

Grahic Jump Location
Fig. 2

Comparison of human and IMD exposure limits for magnetic field (H) as a function of frequency (f)

Grahic Jump Location
Fig. 3

Ansys model for TETS simulation




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